METHOD FOR X-RAY DIFFRACTION CONTROL OF PART Russian patent published in 2013 - IPC G01N23/20 

FIELD: measurement equipment.

SUBSTANCE: X-ray picture is taken off a controlled part, a parameter is determined, which depends on part running time, at the same time X-ray picture taking off the controlled part on the suggested surface of damage is carried out from the reflecting plane (11.0) without background with usage of titanium radiation Ti-K_α and from the reflecting plane (01.3) without background with usage of titanium radiation Ti-K_β, at the same time the parameter depending on running time is the integrated structural parameter Δ, defined as the product of the diffraction line width B parameter without background and diffraction line profile P parameter without background: Δ=B·P, besides, the part is of good quality, if the integrated structural parameter is more than 1: Δ>1.

EFFECT: reduced time of part monitoring, both in process of operation and at the stage of endurance testing of a part and process mobility.

3 cl, 10 dwg