PART STATE ESTIMATION METHOD Russian patent published in 2015 - IPC G01N23/20 

FIELD: instrumentation.

SUBSTANCE: invention is used for estimation of technical state of details by means of X-ray diffraction inspection. The essence of the invention consists in making of X-ray diffraction image of a detail using which the residual compression stresses are determined, the controlling criterion is identified and compared with the limit value, and at the low-cyclic fatigue for the detail with n stress concentrators as a controlling criterion the average value of the stressed state parameter is used, then the average value of the stressed state parameter of the detail with n stress concentrators is compared with minimum and maximum limit values, the detail is returned into service if the average value of the stressed state parameter of the detail with n stress concentrators is greater than the maximum limit value, or the detail is withdrawn from service if the average value of the stressed state parameter is less than the minimum limit value, because the detail is in a limit state at the stage of formation of defect, or the detail is sent for repair in case the average value of the stressed state parameter of the detail is between the minimum and maximum limit values or is close to these values, in other words, if the detail is in a "pre-defective" state.

EFFECT: possibility of estimation of technical state of details in tress concentrators or on surfaces close to stress concentrators located in the plane along the direction of distribution of supposed defect inside metal, and also improvement of accuracy of the obtained results for direct stress concentrators.

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