FIELD: physics.
SUBSTANCE: FTIR system comprises two light sources, a means of anti-phase on and off switching of the first and second light sources, a sample volume with an adjacent sensitive surface, a detector for detecting light reflected from the sensitive surface. The sensitive surface is illuminated with a first light source with observation of the condition for total internal reflection and generation of an attenuated field with a certain attenuation length within the sample volume. The system further includes a means of measuring the attenuation length of the attenuated field and a means of correlating detected signals with change in the attenuation length of the attenuated field.
EFFECT: high sensitivity of the system.
6 cl, 6 dwg
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