METHOD OF MEASURING VOLTAGE-CURRENT AND VOLTAGE-CAPACITANCE CHARACTERISTICS (VERSIONS) Russian patent published in 2013 - IPC G01R27/08 

Abstract RU 2498326 C1

FIELD: radio engineering, communication.

SUBSTANCE: two-terminal device is subjected to a test voltage video pulse; current through the two-terminal device ij and voltage across the two-terminal device uj at discrete moments in time tj is measured; the time derivative of voltage across the two-terminal device u'j at time tj is calculated; results of interpolating tabulated functions are used to obtain the relationship between current through the two-terminal device ir(u) and if(u) and voltage across the two-terminal device at the front and trailing edge of the video pulse, respectively, as well as the relationship between the time derivative of voltage across the two-terminal device u'r(u) and u'r(u) and voltage across the two-terminal device at the front and trailing edge of the video pulse, respectively, wherein the argument of the tabulated functions is the measured voltage across the two-terminal device uj at the front of the video pulse for functions ir(u) and u'r(u) and the measured voltage across the two-terminal device uj at the trailing edge of the video pulse for functions uf(u) and u'f(u), and values of the tabulated functions are the measured values of current through the two-terminal device ij at the front of the video pulse for the function ir(u), the measured values of current through the two-terminal device ij at the trailing edge of the video pulse for the function ir(u), the calculated values of the time derivative of voltage across the two-terminal device u'r(u) at the front of the video pulse for the function u'r(u) and the calculated values of the time derivative of voltage across the two-terminal device u'j at the trailing edge of the video pulse for the function u'r(u), the voltage-current characteristic iIV(u) is calculated using the formula and the voltage-capacitance characteristic C(u) is calculated using the formula or . In the second version of the disclosed method, the voltage-capacitance characteristic is calculated using the formula .

EFFECT: method which enables to simultaneously measure voltage-current and voltage-capacitance characteristics of a two-terminal device using measurements of current through the two-terminal device and voltage across the two-terminal device at discrete moments in time under continuing charge-discharge conditions of the capacitor of the two-terminal device.

3 cl, 3 dwg

Similar patents RU2498326C1

Title Year Author Number
METHOD DETERMINING LEVEL OF NONLINEARITY OF VOLT-AMPERE CHARACTERISTIC OF INERTIA-FREE TWO-TERMINAL NETWORK 1999
  • Karev A.V.
  • Karev I.A.
RU2168736C1
METHOD OF MEASURING VOLT-AMMETRIC CHARACTERISTICS OF TWO-TERMINAL NETWORKS 0
  • Baranchuk Nikolaj Stepanovich
  • Vakulenko Nikolaj Yurevich
  • Gulyj Aleksandr Pavlovich
SU1589218A1
FREQUENCY CONVERTER 0
  • Zabenkov Igor Ivanovich
  • Popov Eduard Gavrilovich
  • Krajko Valerij Konstantinovich
SU1262686A1
METHOD OF CALIBRATION CHECKING OF METERS OF NON-LINEARITY FACTOR OF VARISTORS 0
  • Petukhov Anatolij Ilich
  • Batunin Vladimir Yakovlevich
SU1241170A1
METHOD FOR DETERMINING THE DEPTH DISTRIBUTION PROFILE OF MAJOR CHARGE CARRIER CONCENTRATION IN SEMICONDUCTOR HETEROSTRUCTURES 2023
  • Iakovlev Georgii Evgenevich
  • Zubkov Vasilii Ivanovich
  • Solomnikova Anna Vasilevna
RU2802862C1
MEASUREMENT METHOD OF DIFFERENTIAL RESISTANCE OF NON-LINEAR BIPOLE WITH TEMPERATURE-DEPENDENT VOLT-AMPERE CHARACTERISTIC 2013
  • Sergeev Vjacheslav Andreevich
  • Frolov Il'Ja Vladimirovich
RU2545090C1
METHOD OF DETERMINING VALUES OF THERMOELECTROPHYSICAL PARAMETRES OF TEST SAMPLES OF CONDUCTING OR RESISTIVE STRUCTURES 2008
  • Karev Aleksandr Vladimirovich
  • Karev Ivan Aleksandrovich
RU2372625C1
DEVICE TO MONITOR SEMICONDUCTOR PRODUCTS BY SECOND DERIVATIVES OF CURRENT-VOLTAGE AND VOLT-COULOMB CHARACTERISTICS 2011
  • Sazonov Sergej Nikolaevich
RU2460083C1
STABILIZED D.C. VOLTAGE CONVERTER 0
  • Polikarpov Anatolij Grigorevich
  • Sergienko Evgenij Fedorovich
  • Titkin Vladimir Mikhajlovich
SU1372532A1
METHOD OF DETERMINATION OF POOR ELECTRIC CONTACT 2014
  • Artishchev Sergej Aleksandrovich
  • Semenov Ehduard Valer'Evich
RU2560034C1

RU 2 498 326 C1

Authors

Semenov Ehduard Valer'Evich

Dates

2013-11-10Published

2012-04-19Filed