FIELD: instrumentation.
SUBSTANCE: computer-plotted optical image of analysed material and twofold Fourier transform are used to compute Fraungofer diffraction pattern of said image. Said twofold Fourier transform is used to make second transform of diffraction pattern obtained after first transform. Reiteration intervals Tx and Ty are used to define using the measured minimum distances between adjacent series of main peaks in second computed diffraction pattern Δx2 and Δy2 and computer image magnification factor K1 and are calculated by the formula: Tx=Δx2/K1, Ty=Δy2/K1.
EFFECT: cosimplified and accelerated process.
6 dwg
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