APPARATUS FOR MONITORING PARAMETERS OF ION BEAM Russian patent published in 2014 - IPC G01T1/164 G01T1/29 

FIELD: physics.

SUBSTANCE: invention relates to methods and apparatus for determining the position and intensity of a beam of charged particles. The apparatus for monitoring parameters of an ion beam comprises a scintillator mounted perpendicular to the direction of the ion beam, photodetectors arranged uniformly on the periphery of the scintillator, a circuit for detecting and processing signals from the photodetectors, wherein the scintillator is in form of a disc-shaped light-proof chamber, and the photodetectors are mounted in openings in the sidewall of said chamber and are provided with light filters which are transparent for infrared radiation, wherein the scintillator, along with the photodetectors, is enclosed in a sealed casing with openings for inlet and outlet of a scintillating gas.

EFFECT: high accuracy of determining coordinates of a beam and high speed of operation of the monitoring system.

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