METHOD OF TESTING SYSTEM OF METALLOGRAPHIC ANALYSIS BASED ON SCANNING PROBE MICROSCOPE Russian patent published in 2014 - IPC G01N13/00 

FIELD: nanotechnology.

SUBSTANCE: invention relates to nanotechnologies and methods of carrying out metallographic analysis of samples and determining the three-dimensional topography of their surface and the structure using the atomic-force microscopy with the resolving power in the nanometre range. The method of testing the system of metallographic analysis using a scanning probe microscope (SPM) for the existing equipment in the field, using the model of the structural element of equipment chosen for the analysis. In this model of the structural element the opening is made, in which the model sample is mounted, made of metal, similar to the said structural element, the surface preparation is carried out using the field means and the analysis using the field SPM version. Then the results are compared with the results of the analysis of the same model sample obtained by laboratory method.

EFFECT: increase in reliability of the results of metallographic analysis on the existing equipment.

4 cl, 5 dwg