FIELD: physics.
SUBSTANCE: invention relates to devices for measuring relief, linear dimensions and physical characteristics of the surface of objects using a scanning probe microscope in scanning tunnel microscope and atomic-force microscope modes. In the disclosed device there is possibility of measuring mass of a thin-film sample and dissipative properties of the thin-film sample or liquid medium using piezocrystal microbalances, as well as the possibility of modifying the surface of an object. In the scanning probe microscope combined with a device for measuring mass and dissipative properties, having a unit for controlling the piezocrytal microbalances, a scanning device having a probe holder, a probe, a recording system, a chamber and crystal resonator inside the chamber, where the said crystal resonator has a quartz disc, top and bottom electrodes, there is an optical system, an XYZ positioner and a device for applying voltage between the probe and the top electrode.
EFFECT: broader functionalities of the device.
14 cl, 1 dwg
| Title | Year | Author | Number |
|---|---|---|---|
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|
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| SCANNING PROBE MICROSCOPE COMBINED WITH SAMPLE SURFACE MODIFICATION DEVICE | 2017 |
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