X-RAY ANALYSIS APPARATUS AND METHOD Russian patent published in 2014 - IPC A61B6/03 

FIELD: physics.

SUBSTANCE: invention relates to X-ray analysis equipment. The apparatus has an X-ray source unit for emitting X-rays from a plurality of points, a detection unit for detecting X-rays after passing through the analysis area between the X-ray source unit and the X-ray detection unit, a detected signal processing unit and X-ray emission control unit, in series, separately or in groups, with at least two different energy spectra such that in the time interval during which a specific X-ray source or a group of X-ray sources is switched to emit X-rays with a different energy spectrum, wherein when the specific X-ray source or group of X-ray sources is turned off, another X-ray source or group of X-ray sources is successively turned on to emit X-rays. The analysis method is carried out by the apparatus while using computer-readable medium which stores software for controlling the apparatus to carry out said method.

EFFECT: use of the invention reduces hardware load.

13 cl, 8 dwg