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(11)

2 530 468

(13)

(51)

IPC

G01J1/42(2006-01-01)

H01L39/16(2006-01-01)

(21) (22)

Application

2013122668/28, 2013-05-17

(24)

Start date

2013-05-17

(22)

Actual filing date

2013-05-17

(45)

Published

2014-10-10

(72)

Inventor

Chulkova Galina Merkur'EvnaKorneev Aleksandr AleksandrovichLesnov Il'Ja ViktorovichAbashin Aleksandr Evgen'Evich

(73)

Holder

Federal'Noe Gosudarstvennoe Bjudzhetnoe Obrazovatel'Noe Uchrezhdenie Vysshego Professional'Nogo Obrazovanija Gosudarstvennyj Tekhnicheskij Universitet Im. R.E. Alekseeva"

METHOD OF PARAMETER MEASUREMENT FOR SINGLE-PHOTON INFRARED BAND EMISSION SOURCES Russian patent published in 2014 - IPC G01J1/42 H01L39/16

Abstract RU 2530468 C1

FIELD: measuring instrumentation.

SUBSTANCE: parameters of emission source are measured by single-photon superconductor detector. To implement the method, mean number of counts and number of dark responses of detector are measured. Number of photons registered is determined as a difference between mean number of counts and number of dark responses. Emission power is determined by multiplying number of registered photons by photon energy divided by quantum efficiency of emission receiver.

EFFECT: enhanced measurement accuracy and possible measurement of small power emission.

2 cl, 6 dwg

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RU 2 530 468 C1

Authors

Chulkova Galina Merkur'Evna

Korneev Aleksandr Aleksandrovich

Lesnov Il'Ja Viktorovich

Abashin Aleksandr Evgen'Evich

Dates

2014-10-10—Published

2013-05-17—Filed