FIELD: physics.
SUBSTANCE: reference samples are fabricated in the parallelepiped form with simulated defects for graduation and setting of sensitivity threshold of ultrasonic analyzers, for this purpose the sample technological viaholes with the diameter from 0.5 mm up to 1.0 mm, perpendicular to long axes of the sample and parallel to its effective areas are made, then the processing tool is placed inside, then electric erosion processing is performed to make narrow through grooves by this processing tool, in parallel to through technological holes, with the height from 5 up to 20 diameters of the tool.
EFFECT: possibility to have simulated defects in the form of narrow grooves of the given size, with the given depth in planes, perpendicular to the plane of sending-reception of ultrasonic oscillations and parallelepiped centreline.
4 dwg
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