FIELD: electrical engineering.
SUBSTANCE: this process comprises measurement photocurrent of vacuum photodiode produced by irradiation with continuous or pulse optical radiation of emitter at definite accelerating voltage at anode. Note here that nanostructure emitter planar surface is irradiated by laser beam with wavelength selected from UV-, visible or IR-band at photon energy smaller than emitter electron work function. Fixed voltage U at anode is set that not exceeds that defined from claimed relationship.
EFFECT: possibility to detect optical radiation of micro and milliwatt power.
6 dwg
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