METHOD OF DETERMINING ORIENTATION OF NV DEFECTS IN CRYSTAL Russian patent published in 2015 - IPC C30B29/04 G01N24/10 G01R33/20 B82B1/00 B82Y35/00 

FIELD: nanotechnology.

SUBSTANCE: method of determining the orientation of NV defect in a diamond crystal comprises placement of a sample of the diamond crystal in an external magnetic field, exposure to the sample to microwave radiation, the irradiation of the working volume of the sample with a focused laser radiation exciting in the working volume of the sample photoluminescence on which the signal of optically detected magnetic resonance (ODMR) is recorded, which is created by sweeping the frequency of the microwave radiation and the modulation of the external magnetic field. The ODMR spectra of NV defect are measured in a diamond crystal at different orientations of the diamond crystal relative to the external magnetic field. The received dependences of ODMR lines are compared with the calculated positions of the lines of NV defect in a diamond crystal in a magnetic field. Then, the orientation of the NV defect is determined on the value of the position deviation of the NV lines of the defect from the calculated position of the lines.

EFFECT: method is simple to implement and does not require the use of a complicated device.

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