FIELD: measuring.
SUBSTANCE: use for optical measurement of vector magnetic field. Essence of the invention consists in the fact that a silicon carbide crystal of a hexagonal or rhombic polytype containing spin centres with a ground quadruplet spin state, along its crystallographic axis with symmetry, with focused laser radiation, variable magnetic field of low frequency and constant magnetic field. Photoluminescence (PL) intensity of the spin centres with the ground quadruplet spin state is measured at various values of the constant magnetic field. In the area of variation of PL intensity, a first curve of dependence of variation of PL intensity on the value of constant magnetic field is measured and the first curve is graduated from the known value of the magnetic field value at the inflection point of the first curve. Then, external vector magnetic field is applied, components of external vector magnetic field are zeroed by compensation magnetic fields created by system of Helmholtz coils in three mutually perpendicular directions. Second curves of dependence of change of PL intensity on value of corresponding component of external vector magnetic field are recorded, second curves are graduated by known values of components of magnetic field in point of inflection of corresponding second curve. Absolute value of magnetic field vector |B|, polar angle θ and azimuth angle ϕ are calculated by formulas based on the measured values of Bx, By, Bz of the compensating magnetic fields.
EFFECT: providing the possibility of excluding heating of an object in which the magnetic field is measured, as well as excluding the use of additional equipment for generating high-frequency radiation.
5 cl, 7 dwg
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Authors
Dates
2024-10-23—Published
2024-05-21—Filed