METHOD OF PLACEMENT OF FILM SAMPLES FOR MEASUREMENT OF TEMPERATURE DEPENDENCE OF ELECTRIC RESISTANCE Russian patent published in 2015 - IPC G01N25/18 G01N27/18 G05D23/19 

FIELD: nanotechnologies.

SUBSTANCE: invention relates to nanoelectronics and nanoelectromecanics. For heating of the film sample and measurement of its electric resistance the sample is placed into the housing of the quartz reactor. Inside the housing the sample is placed in C-shaped clips with the flat jaws made from tungsten wire. The sample is placed in flat jaws with preload the size of which is sufficient for holding the sample in the pre-set position when heating C-shaped clips. C-shaped clips are detached on the guys implemented in the form of springs from tungsten wire of smaller diameter. By means of the resistive heater placed on the housing surface the sample is heated to the pre-set temperature. Through C-shaped clips and guys the sample is powered by the measuring current and the voltage is determined. The sample temperature is measured by means of the thermocouple pre-installed in the central part of the housing. The necessary distance from the sample surface to the measuring element of the thermocouple and its centring with reference to the thermocouple is performed by means of the named guys.

EFFECT: stability of electric contact and uniform heating of samples are provided.

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