FIELD: electronics.
SUBSTANCE: invention relates to optoelectronic equipment and concerns a method of determining temperature distribution onto the surface of a light-emitting diode. Method includes a coating material film application onto the LED surface, determination by means of IR imaging microscope of calibration dependence of the signal from temperature at external heating emitted by the LED in idle mode, registration using the IR imaging microscope of the signal emitted by the LED surface in operation mode and software processing of the obtained data. Herewith the coating material is transparent in the area of the LED own electroluminescence, and its properties in relation to absorption and radiation of electromagnetic waves of IR range are close to properties of an absolutely black body in the area of spectral sensitivity of the IR imaging microscope.
EFFECT: technical result is the improvement of accuracy of measurements.
1 cl, 7 dwg
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Authors
Dates
2016-08-20—Published
2015-07-29—Filed