FIELD: thermal imaging measurements.
SUBSTANCE: invention relates to the technique of thermal imaging measurements and is intended for use in metrology for grading, calibration and verification of thermal imaging devices. A method for calibration of thermal imaging devices is claimed, in which the spectral sensitivity of the pixel elements of the receiving matrix of the thermal imaging device is pre-corrected. For this purpose, an optical source of infrared radiation is used, the spectrum of which is as similar as possible to the spectrum of radiation of a black body, and energy brightness is stabilized with a given accuracy, distributed with a given uniformity over an aperture of a given size and shape and is placed in exact correspondence with the thermodynamic temperature of a black body. The spectral sensitivity of pixel elements is adjusted by an amount that is determined based on their brightness and brightness dispersion, the average sample brightness and the average sample brightness dispersion for all pixel elements. As an optical source of infrared radiation, a combination of an optical infrared emitter and an integrating sphere is used, from the output port of which a given spectrum of a given radiation is obtained. This method does not require a long waiting time for the emitter to enter a stationary thermal mode, as is the case in analogues and the prototype. In addition, by providing a high uniformity of brightness across the matrix, the method significantly reduces the likelihood of false signals appearing in the thermal image, which is especially important for thermal imagers used for detection purposes.
EFFECT: increase in the accuracy of calibration with the simultaneous reduction in its duration.
4 cl, 1 dwg
