METHOD FOR ANALYSING SURFACE ON ATOMIC-POWER MICROSCOPE USING FLUORESCENT QUANTUM DOTS Russian patent published in 2017 - IPC G01Q60/38 G01Q70/08 B82Y35/00 

Abstract RU 2631529 C2

FIELD: physics.

SUBSTANCE: method is carried out by means of a quantum dot fixed to the tip of the cantilever needle and located in close mechanical contact with the sample under study. Irradiation of the quantum dot forces it to display fluorescent radiation. The properties of fluorescent radiation are determined both by the properties of the quantum dot and by the properties of the sample surface in its vicinity.

EFFECT: simplified experimental equipment, increased possibilities in the study of physical phenomena on the surface with nanometric spatial resolution.

1 dwg

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RU 2 631 529 C2

Authors

Petrov Aleksandr Borisovich

Bakhtizin Rauf Zagidovich

Gots Sergej Stepanovich

Dates

2017-09-25Published

2016-03-18Filed