FIELD: measuring equipment.
SUBSTANCE: method includes exciting a probing beam of a surface electromagnetic wave on a flat surface of a metal sample, measuring the propagation length of the surface electromagnetic wave and determining its phase velocity, calculation of complex refractive index of the surface electromagnetic wave according to its characteristics and determination of dielectric permittivity of metal by solving the dispersion equation of the surface electromagnetic wave for a wave leading structure containing a surface sample. When measuring, a uniform layer of dielectric with known optical constant thickness from a hundredth to a tenth length of the source radiation wavelength is preliminarily applied on the surface.
EFFECT: increased measurement accuracy.
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