FIELD: measurement technology.
SUBSTANCE: invention relates to research of chemical and physical characteristics of a substance. Integrated-scintillation method of investigation of substance with its introduction into plasma includes: transfer of substance into powder state, shooting of frame spectra of analytical samples of test substances using integrated scintillation spectrometer with virtual division of test substance into a large number of parts by performing periodic intermittent synchronous short-time frame-by-frame recording of spectral emission of plasma of excitation source of spectra, calibration of spectrometer scale, finding in registered spectra of substances location of spectral analytical lines, frame-by-frame sorting of analytical signals, calculation by analytical signals of total intensity of analytical spectral line of chemical element, construction of calibration graphs, sorting of analytical signals of micro hinges, calculation of total intensities of spectral lines of chemical elements, determination by total intensities of spectral lines, calculation of real contents of chemical elements in test substance, determination of element-by-element and phase heterogeneity of substance and evaluation of quality of the substance under study. Moreover, after calibration of measuring scale of integrated scintillation spectrometer, time-lapse registration of spectral analytical background signals of electronic scheme of spectrometer without plasma burning and with plasma without and with introduction of substance into it is carried out. Conduct consideration of time-lapse registered spectra, choose time-lapse part of the spectrum so that background size in this part of the spectrum was close to background size located under analytical line, after this, time-lapse value of analytical signal of determined element is calculated taking into account the background, maximum value of spread of background fluctuations is determined from the measuring scale of the spectrometer, carry out investigations of time-lapse spectra of removed samples of comparison, construct calibration graphs of chemical elements in simple coordinates, control the accuracy of constructed calibration graphs is carried out using the spectra of blank tests and control comparison samples, calculation of total analytical signal of spectral line is performed taking into account selected "threshold signal".
EFFECT: technical result consists in increasing the accuracy and sensitivity of integrated scintillation atomic emission of spectral method.
8 cl, 11 dwg, 4 tbl
