INTERFERENCE METHOD FOR DEFINITION OF THE POSITION OF THE ASPHERIC SURFACE AXIS AND THE DEVICE FOR ITS IMPLEMENTATION Russian patent published in 2018 - IPC G01M11/02 G01B11/27 G02B27/62 G01B9/02 

Abstract RU 2658106 C1

FIELD: optics.

SUBSTANCE: invention can be used in the assembly and alignment of mirror and reflex lenses. Method includes forming of spherical reference and object wave fronts from a coherent source, obtaining an interference pattern as a result of the interaction of the reference and object wave fronts reflected from the reference and aspherical surfaces and determining the position of the axis of the aspherical surface on it. In addition, form a measuring base and a compensator which transforms the object wave front into an aspherical one, coinciding with the theoretical shape of the controlled aspherical surface, combine the axes of the aspherical surface and the compensator by adjusting the aspherical surface to minimize the axis unsymmetric aberrations and determine the relative position of the axes of the compensator and the measuring base.

EFFECT: increase the accuracy of determining the position of the axis of aspherical optical elements, improve the processability of assembly, increase the range of dimensions of controlled aspherical elements and the nomenclature of controlled optical elements.

4 cl, 1 dwg

Similar patents RU2658106C1

Title Year Author Number
INTERFEROMETRIC METHOD OF ADJUSTING TWO-MIRROR LENS WITH ASPHERICAL ELEMENTS 2014
  • Venzel' Vladimir Ivanovich
  • Gorelov Aleksandr Viktorovich
  • Gridin Aleksandr Semenovich
RU2561018C1
INTERFEROMETRIC METHOD FOR ADJUSTMENT OF THREE-COMPONENT LENSES 2021
  • Venzel Vladimir Ivanovich
  • Semenov Andrej Aleksandrovich
RU2776692C1
INTERFEROMETER FOR OPTICAL SURFACE SHAPE CHECKING 0
  • Mustafin Kamil Sabirovich
  • Lukin Anatolij Vasilevich
  • Larionov Nikolaj Petrovich
  • Ibragimov Rafail Azvitovich
SU996857A1
INTERFEROMETER FOR TESTING QUALITY OF SURFACE OF OPTICAL PARTS 0
  • Vavilova Svetlana Aleksandrovna
  • Gorodetskij Aleksandr Alekseevich
  • Rafikov Rafik Abdurafimovich
SU1791701A1
INTERFEROMETER WITH DIFFERENTIAL MEASUREMENT FUNCTION 2020
  • Venzel Vladimir Ivanovich
  • Semenov Andrej Aleksandrovich
  • Solomin Stanislav Olegovich
  • Muraveva Elena Stanislavovna
RU2744847C1
AUTOCOLLIMATION DEVICE FOR CENTERING OPTICAL ELEMENTS 2019
  • Venzel Vladimir Ivanovich
  • Semenov Andrej Aleksandrovich
RU2705177C1
DEVICE FOR DETERMINING POSITIONS OF DEFECTS ON ASPHERICAL SURFACE OF OPTICAL PART (VERSIONS) 2015
  • Larionov Nikolaj Petrovich
  • Agachev Anatolij Romanovich
RU2612918C9
DOUBLE-BEAM INTERFEROMETER 2002
  • Lukin A.V.
RU2209389C1
METHOD FOR MEASURING THE SHAPE OF OFF-AXIS ASSPHERICAL OPTICAL PART 2023
  • Semenov Aleksandr Pavlovich
  • Patrikeev Vladimir Evgenevich
  • Tambovskij Anton Dmitrievich
  • Pridnya Vitalij Vladimirovich
  • Botosh Zlata Denisovna
RU2803879C1
INTERFEROMETRE FOR MONITORING ASPHERICAL QUADRATIC SURFACES 2009
  • Larionov Nikolaj Petrovich
RU2396513C1

RU 2 658 106 C1

Authors

Venzel Vladimir Ivanovich

Semenov Andrej Aleksandrovich

Sinelnikov Mikhail Ivanovich

Dates

2018-06-19Published

2017-07-31Filed