METHOD OF INVESTING THE OBJECT SURFACE BY THE INFRARED DEVICE Russian patent published in 2018 - IPC G01J5/50 G01J5/06 G01K15/00 

FIELD: measuring equipment.

SUBSTANCE: invention relates to the field of infrared (IR) thermography and radiometric methods of temperature measurement and can be used in the visualization and determination of temperature fields on the surface of objects using thermal imaging technology and pyrometric temperature measurements. Method is carried out as following. Before starting the object inspection, the IR device is set up, that consists of inputting into it parameters - the values of the reflected radiation temperature and the radiation coefficient of the surface. Before entering the parameters, they are measured by the same IR device. For this purpose, the temperature of the reflected radiation is initially measured, for this purpose a marker with a known emission factor and with a relative surface roughness in the operating spectral range of IR device RSh=δ/λ, similar to the relative roughness of the surface of the object (δ – roughness of the surface (mcm), λ – average wavelength of the spectral range (mcm)). Relative roughnesses are assumed to be similar if they both exceed one, less than one or about one. In the IR device, the value of the emissivity of the marker is set, the temperature of the marker is measured, for example, by contact method and the marker is monitored by the IR device, subsequently changing the temperature of the reflected radiation introduced into it. When the observed temperature of the marker is reached, close to its measured temperature, the temperature of the reflected radiation is stopped changing and fixed in the device. Then the radiation coefficient is measured with the help of the IR-device on the selected main and, if necessary, additional reference areas of the surveyed surface. To measure the radiation coefficient on the surface of an object, it is possible to create an isolated zone with a known emission factor, for example, by using a label of the corresponding marker, insert the emissivity of the marker into the device, observe the temperature on the marker, and then, changing the radiation coefficient introduced into the device, observe the temperature near the marker, making it coincide with the temperature of the marker. As another method for measuring the radiation coefficient, a method can be used by which the temperature at the reference section is measured by the contact method. Then, the reference portion is monitored by the IR-devices, by which the radiation coefficient value input to the device is also successively changed. After measuring and inputting the radiation coefficients and the reflected radiation temperature into the IR-device, the IR-device is ready for surface inspection.

EFFECT: increase in the accuracy of surveys of the surface of objects by IR devices, that can be achieved by increasing the accuracy of determining the radiation coefficient and the temperature of the reflected radiation.

1 cl