FIELD: electrical engineering.
SUBSTANCE: invention relates to electrical engineering, in particular to methods for determining the location of inhomogeneities in two-wire lines, and is intended for use with pulse devices (reflectometers). Essence of the claimed solution lies in the fact that in the claimed solution it is possible to determine the distance to the inhomogeneity or damage of the two-wire line according to its reflectogram, at which the value of the velocity factor kv is set in the reflectometer, known or calculated from kv=c⋅τz, and some duration of the probing pulse tp, the reflectogram is registered, a pulse reflected from the inhomogeneity or damage is detected on it and the distance ld exp up to the leading edge of the detected pulse is determined, differs in the fact, that after the detection of the pulse reflected from the inhomogeneity, the distance ld max up to the top of the reflected pulse, is measured on a scale (or by means of a cursor), after which the ld exp by numerical solution of the equation is determined: where τz – the specific signal time delay, τ0 – a constructive const of the two-wire line, tp – the duration of the probing pulse, Q=1.371 is the approximation coefficient.
EFFECT: increase in the accuracy of determining the distance to the inhomogeneity (damage) in the two-wire line from its reflectogram.
1 cl, 6 dwg, 3 tbl
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Authors
Dates
2018-07-05—Published
2017-02-13—Filed