METHOD FOR DETERMINING WAVE ABERRATIONS OF OPTICAL SYSTEM Russian patent published in 2019 - IPC G01M11/02 

FIELD: optics.

SUBSTANCE: invention relates to the field of optics and concerns a method for determining wave aberrations. In the implementation of the method homocentric light beam with a wavelength λ is directed to the optical system. Determine the position of the plane P_max, in which the peak intensity of the light beam in the intensity distribution of the light beam has a maximum value of I_max. Measure the distance L_max from plane P_max to the plane P, contacting the last surface of the optical system. Determine the contour of the isophot in the intensity distribution in the plane P_max by the level of 0.2⋅I_max and distance ρ maximum point removal with peak intensity I_max from the isophot contour. Register the intensity distribution I_reg(ξ, η) of light beam in coordinates (ξ, η) of plane P_reg, whose position is chosen at a distance of |L_reg|=16⋅ρ²/λ from plane P_max. Wave aberrations w(x, y) are determined from the equation connecting w(x, y) in the (x, y) coordinates of the plane P with the intensity distribution of the light beam in the plane P_reg.

EFFECT: technical result consists in increasing the accuracy, simplifying the requirements for implementing the operations of the method, reducing the complexity of processing the measurement results and ensuring the possibility of applying the method to optical systems, on which circuit solutions there are no preliminary information.

1 cl, 8 dwg