NON-INVASIVE ANALYSIS OF MATERIAL Russian patent published in 2019 - IPC G01N21/17 

FIELD: measurement.

SUBSTANCE: invention relates to the measurement technique and can be used for non-invasive analysis of a material. Method and system for analyzing material (100) are disclosed. Method comprises the following steps: placing optical medium (10) on the material surface in such a way that at least surface portion (12) of optical medium (10) is in contact with the material surface; radiation of the exciting light beam with the excitation wavelength through surface portion (12) of optical medium (10), which is in contact with the material surface, onto the material surface; radiation of the measuring light beam through optical medium (10) to surface portion (12) of optical medium (10), which is in direct contact with the material surface, in such a way that the measuring light beam and the exciting light beam at the interface of optical medium (10) and the material surface, from which the measuring light beam is reflected, are overlapped; direct or indirect detection of the deviation of the reflected measuring light beam depending on the wavelength of the exciting light beam; and analyzing material (100) based on the detected deviation of the measuring light beam as a function of the wavelength of the exciting light beam.

EFFECT: technical result is an increase in the informativity and reliability of the data obtained.

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