FIELD: measuring equipment.
SUBSTANCE: invention can be used for high-accuracy determination of superconducting layer thickness on high-temperature superconducting wires (HTSW) of the second generation. Essence of the invention consists in that method of gravimetric determination of thickness of superconducting layer of HTSW wires of the second generation includes the following stages: (A) making a reference sample of a HTSW wire containing a substrate coated on a substrate with at least one buffer layer and deposited on a buffer superconducting layer, where the length of the sample corresponds to the length of the wire, wherein the superconducting layer mass is not less than 50 mg; (B) measuring the length, width and weight of the reference sample; (B) dissolving the reference sample superconducting layer in an etching solution which does not interact with the buffer layer material, washing said sample, drying and measuring the sample weight without the superconducting layer; (D) determining the thickness of the superconducting layer of the sample with allowance for the dissolved mass.
EFFECT: enabling accurate determination of the average thickness of the high-temperature superconductor layer on long-length samples.
7 cl, 2 dwg, 3 tbl
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Authors
Dates
2019-05-13—Published
2018-07-23—Filed