FIELD: measuring equipment.
SUBSTANCE: invention relates to measurement equipment, more specifically to devices for measuring gradients of weak magnetic fields. Disclosed is a thin-film gradient meter for measuring gradients of weak magnetic fields, which includes two sensitive elements, spaced in space and having coaxial axes of maximum sensitivity. Sensitive elements are based on resonators with thin magnetic films, each sensitive element has a separate compensation measurement circuit and a separate system for generating a magnetic bias field, and the microwave signal of resonator pumping of sensitive elements is generated by one common microwave generator with a power amplifier.
EFFECT: invention provides reduced noise value of gradient meter and wider operating frequency band.
1 cl, 2 dwg
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Authors
Dates
2019-05-15—Published
2018-05-17—Filed