FIELD: measuring equipment.
SUBSTANCE: invention relates to measurement equipment and is intended for nondestructive quality control and homogeneity of magnetic films by recording ferromagnetic resonance spectra from local sections of thin-film samples. Sensitive element of a ferromagnetic resonance scanning spectrometer with frequency tuning comprises a microwave generator with a driving resonator, amplitude detector and an element interacting with the measured sample area, made in the form of a screen with a measuring hole placed under the resonator, wherein above the measuring hole there is an inductive element of the driving resonator of the microwave generator, wherein the microwave generator additionally contains one or more varicaps designed to adjust the frequency of the driving resonator and to adjust the positive feedback coefficient, and additionally comprises an input for adjusting the base current of the transistor.
EFFECT: possibility of frequency adjustment of sensitive element of FMR scanning spectrometer.
1 cl, 2 dwg
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Authors
Dates
2019-11-26—Published
2019-03-29—Filed