FIELD: physics.
SUBSTANCE: invention discloses an X-ray beam intensity monitoring device and an X-ray radiation monitoring system. X-ray beam intensity monitoring device comprises beam intensity detection module and data processing module, wherein the intensity detection module is adapted such that it is irradiated with an X-ray beam and sends a detection signal, data processing module is connected to intensity detection module to receive detecting signal and output X-ray intensity control signal, wherein the X-ray beam intensity control signal includes an X-ray beam dosimetric control signal and an X-ray radiation brightness correction signal.
EFFECT: technical result is simultaneous performance of dosimetric control and monitoring of X-ray beam brightness, thus improving efficiency of X-ray intensity control device maintenance and improving X-ray intensity control accuracy.
9 cl, 7 dwg
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Authors
Dates
2019-07-19—Published
2015-12-25—Filed