X-RAY BEAM INTENSITY MONITORING DEVICE AND X-RAY RADIATION MONITORING SYSTEM Russian patent published in 2019 - IPC G01T1/172 H05G1/00 

Abstract RU 2695099 C2

FIELD: physics.

SUBSTANCE: invention discloses an X-ray beam intensity monitoring device and an X-ray radiation monitoring system. X-ray beam intensity monitoring device comprises beam intensity detection module and data processing module, wherein the intensity detection module is adapted such that it is irradiated with an X-ray beam and sends a detection signal, data processing module is connected to intensity detection module to receive detecting signal and output X-ray intensity control signal, wherein the X-ray beam intensity control signal includes an X-ray beam dosimetric control signal and an X-ray radiation brightness correction signal.

EFFECT: technical result is simultaneous performance of dosimetric control and monitoring of X-ray beam brightness, thus improving efficiency of X-ray intensity control device maintenance and improving X-ray intensity control accuracy.

9 cl, 7 dwg

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Authors

Kan Ketszyun

Li Shuvej

Chzhan Tsintszyun

Li Yuantszin

Li Yujlan

Chzhao Tszyzhan

Lyu Inon

Lyu Yaokhun

Chzhu Vejbin

Chzhao Syaolin

Khe Khuejshao

Dates

2019-07-19Published

2015-12-25Filed