MICROCONTROLLER CAPACITANCE MEASURING DEVICE FOR BUILT-IN COMPUTER SYSTEMS Russian patent published in 2019 - IPC G01R27/26 

FIELD: measuring equipment.

SUBSTANCE: invention relates to measurement equipment, in particular, to devices for measurement of physical values by capacitive sensors, and can be used in built-in computer control and monitoring systems. Microcontroller capacitance measuring device for built-in computer systems includes resistor 1, capacitive sensor 2, resistor 3, reference capacitor 4, microcontroller 5 and computer 6. Capacitive sensor 1 and reference capacitor 4 are connected to common wire by first plates, second plates of capacitive sensor 1 and reference capacitor 4 are connected to first outputs of resistors 1 and 3, respectively, second leads of resistors 1 and 3 are connected to outputs of first and second pulse-width modulators (PWM), built-in into microcontroller 5 (not shown in PWM drawing), second plates of capacitance sensor 2 and reference capacitor 4 are connected to first and second inputs of analogue multiplexer built into microcontroller 5 (in the drawing analogue multiplexer is not shown), analogue multiplexer output is connected to the analogue-to-digital converter (ADC) built in microcontroller 5 input (not shown in the ADC drawing), computer 6 is connected via digital serial interface to microcontroller 5.

EFFECT: high accuracy of conversion and broader functional capabilities of the device owing to the possibility of using a more sophisticated algorithm for converting capacitance to binary code, as well as high computational and info-communication capabilities of the device by introducing a computer.

1 cl, 1 dwg