FIELD: measuring technology.
SUBSTANCE: invention relates to measuring technology, in particular to devices for measuring physical quantities with capacitive sensors and can be used in embedded computer control systems. The capacitance measurement device for embedded control systems contains (dwg) a microcontroller 1, a computer 2, an RC filter 3, the first resistor 4, the second resistor 5, a capacitive sensor 6, a sample capacitor 7. The capacitive sensor 6 and the sample capacitor 7 are connected to a common wire by the first plates, the second plate of the capacitive sensor 6 is connected to the first terminal of the first resistor 4, the second plate of the sample capacitor 7 is connected to the first terminal of the second resistor 5, the second terminals of the first and second resistors are connected to the corresponding outputs of the two-channel PWM (the two-channel PWM is not shown in dwg) built into the microcontroller 1, the second plates of the capacitive sensor 6 and the sample capacitor 7 are connected, respectively, to the first inputs of the first and second analog comparators (AC) built into the microcontroller 1, the output of the single-channel PWM built into the microcontroller 1 (the single-channel PWM is not shown in dwg) is connected to the input of the RC filter 3, the output of which is connected to the second inputs of the first and second AC, the microcontroller 1 is connected via a digital serial interface to the computer 2.
EFFECT: increase in the accuracy and speed of measuring the device, thanks to the introduction of new connections, which makes it possible to implement a parallel conversion algorithm for measuring and reference RC circuits, and, therefore, provides higher accuracy and speed of measurement.
1 cl, 1 dwg
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Authors
Dates
2022-06-14—Published
2021-09-16—Filed