FIELD: measuring equipment.
SUBSTANCE: invention relates to measuring technology, in particular to devices for measuring physical quantities with capacitive sensors, and can be used in embedded computer control and monitoring systems. A microcontroller capacitance measuring device for embedded computing systems contains: N+1 resistors; a capacitive sensor; a sample capacitor; a microcontroller; a computer.
EFFECT: increased accuracy and speed of capacity measurement.
1 cl, 4 dwg
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