MICROCONTROLLER CAPACITANCE MEASURING DEVICE FOR CONTROL AND MONITORING SYSTEMS Russian patent published in 2020 - IPC G01R27/26 

FIELD: measurement.

SUBSTANCE: invention relates to measurement equipment, in particular, to devices for measurement of physical values by capacitive sensors, and can be used in embedded computer control and monitoring systems. Microcontroller capacitance measuring device for control and monitoring systems includes resistors 1, 2, 3, 4, capacitive sensor 5, microcontroller 6, RC-filter 7 and computer 8. First capacitance sensor 5 capacitance is connected to the common wire, the second capacitance sensor 5 capacitance is connected to the first outputs of resistors 1, 2 and to the first input of the analogue comparator (not shown) built into microcontroller 6, the second outputs of resistors 1 and 2 are connected to the outputs, respectively, first and second pulse-width modulators (PWM) built into microcontroller 6 (PWM not shown), output of third PWM (not shown) built into microcontroller, is connected to input of RC-filter 7, the output of which is connected to the second input of analogue comparator, which is built into microcontroller 6. First outputs of resistors 3 and 4 are connected to input of analogue-to-digital converter (ADC) built-in into microcontroller 6 (ADC is not shown), the second output of resistor 3 is connected to digital output of microcontroller 6, the second output of resistor 4 is connected to common wire. Computer 8 is connected through digital serial interface to microcontroller 6. Computer can be a Raspberry Pi microcomputer.

EFFECT: technical result when implementing the disclosed solution is high accuracy of conversion and broader functional capabilities of the device, owing to the possibility of using a more advanced algorithm for converting capacitance to binary code, as well as increased computing and information-communication capabilities of the device by introducing a computer.

1 cl, 1 dwg