FIELD: electrical engineering.
SUBSTANCE: invention relates to power electronics and is intended for non-destructive testing of quality of manufacturing of photothyristors for compliance with the group in terms of rate of voltage rise in closed state and can be used in production of photothyristors and operation. Device for monitoring quality of manufacturing of photothyristor comprises power supply connected to signal generating device of specified shape, a pulse amplitude controller, a voltage source which sets the test voltage amplitude level, a voltage stabilizer and a diode, wherein the signal shaping device of a predetermined shape comprises a charging voltage rate regulator, a test voltage source, a charging circuit, a control unit, a key driver, a forming circuit, a reset key, a holding current source, a measuring module, an opening current detector, an impulse parameter detector and a buffer capacitor.
EFFECT: high efficiency of operation of the device owing to possibility of checking photothyristors by parameter of critical speed of voltage rise in closed state.
3 cl, 1 dwg
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Authors
Dates
2019-10-08—Published
2018-11-16—Filed