DEVICE FOR MEASURING PARAMETERS OF CRYSTALLIZATION KINETICS Russian patent published in 2019 - IPC G01N25/02 C30B9/00 G01N21/84 

FIELD: measurement technology.

SUBSTANCE: invention relates to investigation of phase changes of substance and is intended for measurement of growth rate of crystals and rate of formation of crystallization centers during crystallization of melt or during formation of crystals from solution. Disclosed is a device for measuring parameters of crystallization kinetics, which includes two chambers – a measuring chamber, placed in a casing, made with a detachable cover, on which there is a viewing window for a microscope, and an illumination chamber, separated by a plate with a layer of heat insulation with a cylindrical hole in the center and with a slot for placing glass with a housing on the plate in the form of a thin-walled cylinder, on which there is a measuring cell and mounted a coiling coil of cooling and under it a clamp electric heater. Plate has mounting holes for the cylinder body and the illumination chamber, on the walls of which there are two fans – suction and blowing air – and a plate for fixing the LEDs.

EFFECT: high accuracy of controlling heating and overcooling over shorter time intervals.

1 cl, 6 dwg