FIELD: nanotechnologies.
SUBSTANCE: invention relates to micro- and nanotechnology. Method for nondestructive monitoring of magnetization of epitaxial ferrite film on non-magnetic substrate involves simultaneous exposure of permanent magnetic field and microwave field to magnetic field, measurement of microwave signals at film output and determination of film magnetization parameters by calculation, wherein the constant magnetic field is oriented along the normal to the surface of the ferrite film, the microwave field is exposed to a magnetic field in a pulsed mode, by adjusting the constant magnetic field value and / or the frequency of the radio pulses filling until excitation of exchange spin waves in the ferrite film of radio pulses running into the ferrite film and reflected from its opposite surface, delay time of reflected echo pulses of exchange spin waves and corresponding values of frequency of filling of radio pulse and constant magnetic field are measured.
EFFECT: broader functional capabilities of the nondestructive inspection method.
1 cl, 6 dwg
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