FIELD: physics.
SUBSTANCE: invention relates to radiation engineering, namely to radiological imaging systems, and is used to obtain information on the point spread function (PSF). Essence of the invention lies in the fact that the method of determining the X-ray imaging system point dispersion function further comprises steps, on which from basic point scattering function determined using diaphragm with round hole, edge or slit test objects, geometric contours and intensity profile are calculated on a real focal spot with further calculation of the projection of the actual focal spot to the point or pixel of the detector at given geometrical parameters and spatial sampling taking into account pixel size and intrinsic scattering function of the point in the detector.
EFFECT: high accuracy of determining the scattering function of a point in X-ray imaging systems.
1 cl, 1 dwg
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