TEM TEST CELL FOR ESTIMATING NOISE EMISSION AND NOISE IMMUNITY OF INTEGRATED CIRCUITS Russian patent published in 2020 - IPC H01P1/00 

FIELD: measuring equipment.

SUBSTANCE: invention relates to measurement equipment, namely to test devices, and can be used for research and testing of objects in the field of electromagnetic compatibility (EMC). Disclosed TEM test cell for estimating noise emission and noise immunity of integrated circuits includes a central plate, which is located inside housing, central part of which is made of four conducting surfaces, in one of which there is a cutout, and the surfaces form a rectangular parallelepiped, the open ends of which are connected to the matching transitions and the high-frequency connectors, and is characterized in that the body central part has a rectangular or circular cutout and is formed by a parallelepiped of equal length and width, wherein height of parallelepiped is formed by rectangle in cross section with ratio of sides of 1/0.3, which is connected at each end with matching transition length of 1/11 of length of central part, made in form of its narrowing at angle of 11.9° at its constant height, which at the end is connected to a regular portion having a rectangular cross-section with ratios of sides of 1/12 of width and 1/75 of the length of the central portion to which the high-frequency connector body is attached, and its central conductor, installed in regular part through round hole, is soldered to central plate shifted by distance equal to 1/22 from height, relative to cell axis in longitudinal section, which is made of a conductive material with width of 1/2.5 of the width of the central part of the body, and length of 1/1.016 of the length of the central part of the body, and has two narrowing at angles 43.3° at distance of 1/10 from end of central part of housing and 31.8° at distance of 1/50 from the beginning of the through hole in the regular portion.

EFFECT: technical result consists in the possibility of increasing the maximum operating frequency of cell to 5_3 GHz, with dimensions of the test object of not more than 30×30×5 mm³ and VSWR value not more than 1_2.

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