DEVICE FOR MEASURING SPECIFIC RESISTANCE OF SEMICONDUCTOR CUTTING CERAMIC PLATES Russian patent published in 2020 - IPC G01N27/02 G01R27/02 

FIELD: monitoring and measuring equipment.

SUBSTANCE: invention relates to control and measurement equipment for determining specific resistance of semiconductor replaceable polyhedral cutting plates of oxide-carbide ceramics. A device for measuring specific resistance of cutting ceramic plates, comprising a current source and an Ohmmeter registration means connected to probing electrodes. According to the invention, in the housing of the device there are two channels communicating with the chambers and filled with current-conducting liquid material, into which threaded elements are installed on the outer side, wherein the metal balls are located inside the channels, device housing has a groove accommodating a detachable case made in the form of two parts, a body and a cover, with through square holes to which electrodes are connected, note here that O-rings are installed on outer sides of cover and body of case. Sample of ceramic plate is installed in case.

EFFECT: invention is intended for nondestructive determination and control of microstructural parameters of material, which directly affect efficiency of cutting ceramics.

1 cl, 4 dwg