FIELD: defectoscopy.
SUBSTANCE: invention can be used for nondestructive inspection of structures. Essence of the invention lies in the fact that the multichannel acoustic emission device consists of n units, each of which comprises four measurement channels consisting of in-series connected acoustic transducer, preliminary amplifier, first two-position switch, as well as an analog bandpass low-pass filter, a programmable variable gain amplifier, an analogue-to-digital converter, random-access memory, a PCI bus, a computer central processing unit, a digital signal processor, a digital-to-analogue gain control converter, the output of which is connected to the second input of the programmable amplifier, the calibration pulse generator, the digital-to-analogue threshold converter, output of which is connected to first input of adder and first input of two-way switch, output of programmable amplifier is connected to detector input, input of analogue-to-digital converter and non-inverting input of comparator, detector output is connected to the integrator input, the output of which is connected to the adder second input, and its output is connected to the second input of the on / off switch, the output of which is connected to the inverting input of the comparator, the output of which is connected to the second input of the control device, digital output of the analogue-to-digital converter is connected to the input of the digital filter, the output of which is connected to the digital bus of the control device, each channel additionally comprising fast and slow mode band filters, which outputs are connected to series-connected analogue signal detector, analogue signal integrator, programmable divider and analog comparator, wherein first inputs of band-pass filters are connected to second output of two-way switch, second inputs of band-pass filters, analogue signal integrators, programmable dividers and analogue comparator output are connected to outputs of control device.
EFFECT: high reliability of results of monitoring and assessment of degree of risk of defects.
1 cl, 1 dwg
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Authors
Dates
2020-11-12—Published
2020-04-27—Filed