FIELD: measuring equipment.
SUBSTANCE: invention can be used as a temperature sensor as part of cryogenic installations whose operating temperatures are below the critical temperature of a massive superconducting material used in a thermometer. According to the claimed solution, the temperature range of the superconducting transition of the film as a whole is expanded in comparison with the width of the superconducting transition of the massive superconductor from which the film is made. The principle of operation is based on the fact that in a film with a variable thickness, in the presence of the proximity effect, there is a temperature range within which a localized boundary (NS-boundary) occurs, dividing the electronic states into regions of the superconducting phase (R=0) and the normal phase (R≠0). Such a boundary changes its position with a change in the substrate temperature, as a result of which the total resistance of the film in the operating temperature range is different from zero and changes smoothly with a change in the substrate temperature. The calibration of such a thermometer is similar to the calibration of any other secondary thermometer of this temperature range.
EFFECT: fact that the sensor changes its resistance in a certain temperature range located below the critical temperature of the superconductor and amounting to several tens of percent of the critical temperature value.
1 cl, 3 dwg, 1 tbl
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Authors
Dates
2021-10-05—Published
2020-12-08—Filed