FIELD: material processing.
SUBSTANCE: invention is used for the processing of sifted material. A device for the processing of sifted material contains a screen deck and/or a screen chute, along which or relatively to which sifted material is moved, as well as an ultrasound detection system that contains: an ultrasound transmitter located at the specified device and made with the possibility of sending an ultrasound signal to a surface, along which sifted material is moved, to determine a parameter, such as a depth of a sifted material layer on the specified surface, an ultrasound receiver made with the possibility of receiving an ultrasound signal, and a control unit connected to the ultrasound transmitter and the ultrasound receiver. The control unit is made with the possibility of determining at least one parameter of the ultrasound signal. At the same time, the control unit is also made with the possibility of determining a difference in the specified at least one parameter based on the comparison of the ultrasound signal and a reference signal. In this case, the ultrasound detection system contains a lattice containing a set of ultrasound transmitters and ultrasound receivers. Each ultrasound transmitter and ultrasound receiver are located above the surface of the device screen deck or is located near the surface of the device screen deck. In this case, the device contains a deflector made with the possibility of deflecting the ultrasound signal directed to the specified surface.
EFFECT: providing the possibility of obtaining such parameter as a depth of the sifted material layer on the deck.
27 cl, 8 dwg
