METHOD FOR NON-CONTACT MEASURING OF THE DENSITY OF ELECTRONIC STATES Russian patent published in 2023 - IPC G01R3/00 G01R29/00 

FIELD: density measurement.

SUBSTANCE: invention relates to measurements of the density of electronic states in two-dimensional conductive crystalline films. Essence: non-contact measurement of the density of electronic states in two-dimensional conductive crystalline films is to determine the density of electronic states in the material according to the experimentally measured distribution profile of the charge density of a stationary wave formed along the edge of the Mobius strip in a quantizing magnetic field. A stationary charge density wave is formed along the edge of the strip when the mean free path of electrons does not exceed the width of the Mobius strip. The profile of the charge density stationary wave is determined by the relationship between the dependence of the chemical potential of charge carriers on the magnetic field and the electrostatic potential due to the screened Coulomb repulsion.

EFFECT: possibility of non-contact obtaining of the information about the density of electronic states in two-dimensional crystalline films.

1 cl, 2 dwg