METHOD OF NON-DESTRUCTIVE TESTING FOR LOF-TYPE DEFECTS, STANDARD PART FOR TESTING AND METHOD OF ITS PRODUCTION Russian patent published in 2023 - IPC G01N1/28 B22F3/105 

FIELD: testing products for processing quality.

SUBSTANCE: method for producing a standard part with LOF-type defects, a standard part with LOF-type defects, and a method of non-destructive testing for LOF-type defects are described. The method for producing a standard part with LOF-type defects includes setting a LOF-type defect area of the standard part, in the LOF-type defect area, the proportion of defects is set as the first share value. An additive manufacturing forming process is then selected to produce the LOF defect area to obtain a first additive manufacturing forming process parameter corresponding to the first share value. The forming process for additive manufacturing is carried out based on the first process parameter to form an area of LOF-type defects.

EFFECT: provision of accurate and reliable test results for products.

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