FIELD: accelerator technology.
SUBSTANCE: invention relates to diagnostic devices for electron beams used in accelerator technology. The essence of the invention lies in the fact that the profilometer contains at least two cameras installed on an adjustment platform, a radiation output mirror with an adjustment system, and a system of mirrors. Cameras with short exposure times are removed from the zone of direct exposure to ionizing radiation. The radiation output mirror is installed opposite the vacuum radiation-resistant window in such a way that the resulting image of the process is reflected onto a system of mirrors, the mirrors of which are installed opposite the cameras and reflect the resulting image of the process from the radiation output mirror to the cameras.
EFFECT: increase in the accuracy of determining the profile of a high-current electron beam.
3 cl, 3 dwg
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