FIELD: computer technology.
SUBSTANCE: invention is intended for testing input/output devices of automated control systems (ACS). The effect is achieved by setting the duration of diagnostic tests and the accuracy of estimating the mean time between failures β. When testing an I/O device, the device continuously polls the status of the I/O device for a specified duration of diagnostic tests and, when hardware failures occur, reads data from the I/O device via the polling channel to determine the number of hardware failures N, the failure rate and failures and calculates the value of the indicator probability of failures and failures of the input/output device Iβ using the first block of calculations. The obtained parameter values β, N, Iβ are used by the second block of calculations to calculate the test completion indicator E, in accordance with the value of which decisions are made to interrupt or stop the tests.
EFFECT: reduced testing time of input/output devices by determining the test completion time.
1 cl, 2 dwg, 1 tbl
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Authors
Dates
2024-01-11—Published
2023-05-12—Filed