METHOD FOR TESTING ELECTRONIC DEVICES BASED ON AUTOMATIC TEST GENERATION Russian patent published in 2024 - IPC G05B23/02 G06F11/263 

FIELD: computer technology.

SUBSTANCE: method contains the following steps: implementing hardware-software models (HSM) of electronic devices; with the help of these HSMs, control actions (CAs) are issued to the tested electronic devices (TED) in the form of electrical signals, and response reactions (RRs) are measured in the form of electrical signals received from the TED; typical operations are defined that are planned to be used for testing a specific TED; a basic test is formed consisting of certain standard operations; based on the basic test, derivative tests are generated, with a modified sequence of issuance and the composition of standard operations, while maintaining the standard composition of operations. Based on the generated derivative test, the TED is tested by issuing CAs in the form of electrical signals and reading the RRs.

EFFECT: expanded functionality of tests due to formation of derivative tests with an increased number of instances of operations.

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