DEVICE FOR HIGH-TEMPERATURE TESTING OF FLAT SAMPLES FROM CERAMIC AND COMPOSITE MATERIALS Russian patent published in 2024 - IPC G01N3/18 G01N25/72 

FIELD: technical physics; tests.

SUBSTANCE: invention relates to the field of technical physics, namely to devices for high-temperature testing of flat samples from ceramic and composite materials, and can be used to determine elastic characteristics of materials during tests at alternating loads. Device contains cooled grippers with dovetail slots, intended for sample attachment, heaters arranged coaxially with the grippers and forming an open central zone intended to accommodate the working part of the test sample, and optical devices for controlling deformation fields arranged in two directions with the possibility of accessing the open central zone. Each of the optical deformation fields monitoring means is made in the form of a sapphire monocrystal intended for contact with the test sample working part, housing intended for placement of sapphire monocrystal and made of material with low thermal conductivity, and a contactless extensometer connected to the sapphire monocrystal housing to form a vacuum zone. Device is equipped with retainers of the axial position of the test sample, which are made in the form of strained wedge joints, each of which is a pair of wedges located in the slot of the “dovetail” type of the corresponding grip. Angle of inclination of wedges in connection is less than double angle of friction.

EFFECT: high accuracy of determining deformation fields at alternating loads during testing.

1 cl, 4 dwg