METHOD OF DETERMINING NANOPARTICLES IN HIGH-PURITY ACIDS Russian patent published in 2024 - IPC G01N15/205 B82Y35/00 

FIELD: measurement.

SUBSTANCE: invention relates to determination of concentration of suspended nanoparticles in high-purity acids and can be used to control purity of acids during their production, as well as in nano- and microelectronics. Method for determining the concentration of suspended nanoparticles in a highly pure acid is characterized by the fact that photofixation of the number of breakdowns is carried out on an organic light-emitting diode (OLED), which is a multilayer composition in which successively deposited layers provide transfer and injection of charge carriers into the radiating layer. OLED is prepared on a substrate coated with nanoparticles deposited from an analysed solution, and places of breakdowns corresponding to arrangement of nanoparticles on surface of substrate are displayed on micrographs in the form of dark spots. Number of breakdowns is converted to concentration of nanoparticles in analysed high-purity acid according to equation: , where N is the total number of breakdowns on the electroluminescence micrograph of the OLED minus the results of the blank experiment (OLED, which does not contain nanoparticles from the analysed acid), pcs., V is the volume of the dispersion containing the nanoparticles of the analysed high-purity acid, which was deposited on the substrate for the OLED before production thereof, ml; a is the degree of evaporation when concentrating an aliquot of the analysed high-purity acid. For the result of determining the concentration of suspended nanoparticles in the analysed high-purity acid, the average value of C is used from those obtained by formula: C = , where n is the number of analysed OLED with nanoparticles.

EFFECT: wider range of methods for determining nanoparticles in high-purity acids, simple method and possibility of indirect visualization of single nanoparticles in liquid media.

1 cl, 2 dwg