SYSTEM FOR AUTOMATED TESTING OF SEMICONDUCTOR DEVICES Russian patent published in 2024 - IPC G01R31/26 G05B23/02 

Abstract RU 2830387 C1

FIELD: microwave equipment.

SUBSTANCE: invention relates to microwave engineering and is intended for testing in order to confirm the claimed characteristics of digital semiconductor devices in boundary operating modes. In the disclosed system, the power supply unit is connected by its input to the output of the control unit, which is a microcontroller which is connected to a computer, and by its output to the input of the logic level switching unit. Control unit output is connected to voltage and current measurement units, respectively. Power supply unit is connected by outputs to inputs of the logic level switching unit, which is connected by outputs to the tested device and to the current measurement unit, which is connected to the ammeter by its output. Power supply unit is also connected by outputs to the inputs of the voltage measurement unit, the output of which is connected to a voltmeter. VNA, voltmeter and ammeter are connected to computer input.

EFFECT: wider field of application.

1 cl, 3 dwg

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RU 2 830 387 C1

Authors

Shesterikov Aleksandr Evgenevich

Shesterikova Daria Aleksandrovna

Dates

2024-11-18Published

2024-05-07Filed